Ghent University Academic Bibliography

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In situ study of the formation of silicide phases in amorphous Co-Si mixed layers

Charlotte Van Bockstael, Koen De Keyser, Jelle Demeulemeester, André Vantomme, Roland Vanmeirhaeghe (UGent) , Christophe Detavernier (UGent) , Jean Jordan-Sweet and Christian Lavoie

(2010) MICROELECTRONIC ENGINEERING. 87(3). p.282-285
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Texture of CoSi2 films on Si(111), (110) and (001) substrates

Koen De Keyser, Christophe Detavernier (UGent) , J Jordan-Sweet and C Lavoie

(2010) THIN SOLID FILMS. 519(4). p.1277-1284
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- Conference Paper
- P1
- open access
The texture of thin NiSi films and its effect on agglomeration

Koen De Keyser, Christophe Detavernier (UGent) , Roland Vanmeirhaeghe (UGent) , Jean Jordan-Sweet and Christian Lavoie

(2009) CERAMIC TRANSACTIONS. 201. p.3-10
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- Journal Article
- A1
In situ x-ray diffraction study of metal induced crystallization of amorphous germanium

Werner Knaepen (UGent) , S Gaudet, Christophe Detavernier (UGent) , Roland Vanmeirhaeghe (UGent) , J Sweet and C Lavoie

(2009) JOURNAL OF APPLIED PHYSICS. 105(8).
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- Journal Article
- A1
Influence of a transient hexagonal phase on the microstructure and morphological stability of NiSi films

Charlotte Van Bockstael, Koen De Keyser, Roland Van Meirhaeghe, Christophe Detavernier (UGent) , Jean Jordan-Sweet and Christian Lavoie

(2009) Applied Physics Letters. 94(3).
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- Journal Article
- A1
In situ study of the formation of silicide phases in amorphous Ni-Si mixed layers

Charlotte Van Bockstael, Christophe Detavernier (UGent) , Roland Vanmeirhaeghe (UGent) , Jean Jordan-Sweet and Christian Lavoie

(2009) Journal of Applied Physics. 106(6). p.064515-1-064515-
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Simultaneous real-time x-ray diffraction spectroscopy, Rutherford backscattering spectrometry, and sheet resistance measurements to study thin film growth kinetics by Kissinger plots

Dries Smeets, Jelle Demeulemeester, Davy Deduytsche (UGent) , Christophe Detavernier (UGent) , CM Comrie, CC Theron, Christian Lavoie and André Vantomme

(2008) JOURNAL OF APPLIED PHYSICS. 104(10).
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Formation and stability of NiSi in the presence of Co and Fe alloying elements

Davy Deduytsche (UGent) , Christophe Detavernier (UGent) , Roland Vanmeirhaeghe (UGent) , Jean Jordan-Sweet and Christian Lavoie

(2008) JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B. 26(6). p.1971-1977
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- Journal Article
- A1
Nucleation and diffusion during growth of ternary Co1-xNixSi2 thin films studied by complementary techniques in real time

Dries Smeets, Jelle Demeulemeester, Koen De Keyser, Davy Deduytsche (UGent) , Christophe Detavernier (UGent) , CM Comrie, CC Theron, Christian Lavoie and André Vantomme

(2008) JOURNAL OF APPLIED PHYSICS. 104(9).
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- Journal Article
- A1
Epitaxial formation of a metastable hexagonal nickel-silicide

Koen De Keyser, Charlotte Van Bockstael, Christophe Detavernier (UGent) , Roland Vanmeirhaeghe (UGent) , J JORDAN-SWEET and C LAVOIE

(2008) ELECTROCHEMICAL AND SOLID STATE LETTERS. 11(9).

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Academic Bibliography

In situ study of the formation of silicide phases in amorphous Co-Si mixed layers

Texture of CoSi2 films on Si(111), (110) and (001) substrates

The texture of thin NiSi films and its effect on agglomeration

In situ x-ray diffraction study of metal induced crystallization of amorphous germanium

Influence of a transient hexagonal phase on the microstructure and morphological stability of NiSi films

In situ study of the formation of silicide phases in amorphous Ni-Si mixed layers

Simultaneous real-time x-ray diffraction spectroscopy, Rutherford backscattering spectrometry, and sheet resistance measurements to study thin film growth kinetics by Kissinger plots

Formation and stability of NiSi in the presence of Co and Fe alloying elements

Nucleation and diffusion during growth of ternary Co1-xNixSi2 thin films studied by complementary techniques in real time

Epitaxial formation of a metastable hexagonal nickel-silicide

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