Ghent University Academic Bibliography

Your filters: cql: publisher exact "ELECTROCHEMICAL SOC INC"

Add to list
- Journal Article
- A1
Comparative study of carrier lifetime dependence on dopant concentration in silicon and germanium

E GAUBAS and Jan Vanhellemont (UGent)

(2007) JOURNAL OF THE ELECTROCHEMICAL SOCIETY. 154(3).
Add to list
- Journal Article
- A1
Single crystal CaS: Eu and SrS: Eu luminescent particles obtained by solvothermal synthesis

Jo Van Haecke, Philippe Smet (UGent) , Koen De Keyser and Dirk Poelman (UGent)

(2007) JOURNAL OF THE ELECTROCHEMICAL SOCIETY. 154(9).
Add to list
- Journal Article
- A1
- open access
Adhesive bonding of InP/InGaAsP dies to processed silicon-on-insulator wafers using DVS-bis-benzocyclobutene

Günther Roelkens (UGent) , Joost Brouckaert (UGent) , Dries Van Thourhout (UGent) , Roel Baets (UGent) , R NOTZEL and Meint Smit (UGent)

(2006) JOURNAL OF THE ELECTROCHEMICAL SOCIETY. 153(12).
Add to list
- Journal Article
- A1
Chemical modification of buildup epoxy surfaces for altering the adhesion of electrochemically deposited copper

Sam Siau, Alfons Vervaet (UGent) , Etienne Schacht (UGent) , S DEGRANDE, Katrien Callewaert and André Van Calster (UGent)

(2005) JOURNAL OF THE ELECTROCHEMICAL SOCIETY. 152(9).
Add to list
- Journal Article
- A1
Impact of direct plasma hydrogenation on thermal donor formation in n-type CZ silicon

JM RAFI, E SIMOEN, C CLAEYS, YL HUANG, AG ULYASHIN, R JOB, Jorg Versluys, Paul Clauws (UGent) , M LOZANO and F CAMPABADAL

(2005) JOURNAL OF THE ELECTROCHEMICAL SOCIETY. 152(1).
Add to list
- Journal Article
- A1
The formation of Eu2+ clusters in saturated red Ca0.5Sr0.5S: Eu electroluminescent devices

Jo Van Haecke, Philippe Smet (UGent) and Dirk Poelman (UGent)

(2005) JOURNAL OF THE ELECTROCHEMICAL SOCIETY. 152(12).
Add to list
- Journal Article
- A1
Adhesion strength of the epoxy polymer/copper interface for use in microelectronics

Sam Siau, Alfons Vervaet (UGent) , L VAN VAECK, Etienne Schacht (UGent) , Ulric Demeter (UGent) and André Van Calster (UGent)

(2005) JOURNAL OF THE ELECTROCHEMICAL SOCIETY. 152(6).
Add to list
- Journal Article
- A1
Influence of chemical pretreatment of epoxy polymers on the adhesion strength of electrochemically deposited Cu for use in electronic interconnections

Sam Siau, Alfons Vervaet (UGent) , Etienne Schacht (UGent) and André Van Calster (UGent)

(2004) JOURNAL OF THE ELECTROCHEMICAL SOCIETY. 151(2).
Add to list
- Journal Article
- A1
Characterization of oxide precipitates in heavily B-doped silicon by infrared spectroscopy

Olivier DE GRYSE, Paul Clauws (UGent) , Jan Vanhellemont (UGent) , OI LEBEDEV, J VAN LANDUYT, E SIMOEN and C CLAEYS

(2004) JOURNAL OF THE ELECTROCHEMICAL SOCIETY. 151(9).
Add to list
Kinetic study of wet chemical treatments on the surface roughness of epoxy polymer layers for buildup layers - II. Oxidative treatment of the surface

Sam Siau, Alfons Vervaet (UGent) , Sylvie Nalines, Etienne Schacht (UGent) and André Van Calster (UGent)

(2004) JOURNAL OF THE ELECTROCHEMICAL SOCIETY. 151(12).

Academic Bibliography

Comparative study of carrier lifetime dependence on dopant concentration in silicon and germanium

Single crystal CaS: Eu and SrS: Eu luminescent particles obtained by solvothermal synthesis

Adhesive bonding of InP/InGaAsP dies to processed silicon-on-insulator wafers using DVS-bis-benzocyclobutene

Chemical modification of buildup epoxy surfaces for altering the adhesion of electrochemically deposited copper

Impact of direct plasma hydrogenation on thermal donor formation in n-type CZ silicon

The formation of Eu2+ clusters in saturated red Ca0.5Sr0.5S: Eu electroluminescent devices

Adhesion strength of the epoxy polymer/copper interface for use in microelectronics

Influence of chemical pretreatment of epoxy polymers on the adhesion strength of electrochemically deposited Cu for use in electronic interconnections

Characterization of oxide precipitates in heavily B-doped silicon by infrared spectroscopy

Kinetic study of wet chemical treatments on the surface roughness of epoxy polymer layers for buildup layers - II. Oxidative treatment of the surface

Contents

Support

Contact