Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions News feed Embed this list Save this search Mark all Export Your filters: cql: parent exact "Reliable and quantitative prediction of defect properties in Ga-based semiconductor... Mark conference C3 Discriminating defects and device responses in capacitance spectroscopic methods Sheng Yang (UGent) , Johan Lauwaert (UGent) , Samira Khelifi (UGent) , Henk Vrielinck (UGent) , Ana Obradović (UGent) , Jeroen Lauwaert (UGent) and Joris Thybaut (UGent) (2018) Reliable and quantitative prediction of defect properties in Ga-based semiconductors, CECAM workshop abstracts.