Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: parent exact "Proc. of the IEEE Instrumentation and Measurement Technology Conference & IMEKO Tec... Add to list Conference Paper C1 Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems. Kurt Haelvoet, Steven Criel, F DOBBELAERE, Luc Martens (UGent) , Pascal De Langhe and R DE SMEDT (1996) Proc. of the IEEE Instrumentation and Measurement Technology Conference & IMEKO Technical Committee 7, Vol. 2, 4-6 June Brussels, Belgium, pp. 1119-1123.