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Enhancing the Forward Gate Bias Robustness in p-GaN Gate High-Electron-Mobility Transistors through Doping Profile Engineering
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QCM-D viscoelastic and adhesion monitoring facilitate label-free and strain-selective bacterial discrimination
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Low cost, sensitive impedance detection of E. Coli bacteria in food-matrix samples using surface-imprinted polymers as whole-cell receptors
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- Journal Article
- A1
- open access
Lifetime assessment of In(x)Ga(1-x)As n-type hetero-epitaxial layers
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Defect characterization in high-electron-mobility transistors with regrown p-GaN gate by low-frequency noise and deep-level transient spectroscopy
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Semiconductor nanostructures for electronic and opto‐electronic device applications
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Device performance as a metrology tool to detect metals in silicon
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Observation of the stacking faults in In0.53Ga0.47As by electron channeling contrast imaging
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Impact of in situ annealing on the deep levels in Ni‐Au/AlN/Si metal-insulator-semiconductor capacitors
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Growth of Au nanoparticles in NiO via short annealing of precursor material thin film and optimization of plasmonics