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- Journal Article
- A1
- open access
Scaling of e-mode power GaN-HEMTs for low voltage/low Ron applications : implications on robustness
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Demonstration of Schottky barrier diode integrated in 200 V power p-GaN HEMTs technology with robust stability
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Impact of doping and geometry on breakdown voltage of semi-vertical GaN-on-Si MOS capacitors
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Capture and emission time map to investigate the positive VTH shift in p-GaN power HEMTs
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Exploration of gate trench module for vertical GaN devices
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Role of the AlGaN barrier on the long-term gate reliability of power HEMTs with p-GaN gate
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In-circuit fault tolerance for FPGAs using dynamic reconfiguration and virtual overlays
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- Journal Article
- A1
- open access
ESD-failure of E-mode GaN HEMTs : role of device geometry and charge trapping
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Four-point bending cycling : the alternative for thermal cycling solder fatigue testing of electronic components
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Analysis of nonlinear heat exchange phenomena in natural convection cooled electronics systems