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Terman method to study threshold voltage hysteresis of Si/SiGe heterostructures at cryogenic temperatures
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Analysis of RTN induced by forward gate stress in GaN HEMTs with a Schottky p-GaN gate
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High-temperature PBTI in trench-gate vertical GaN power MOSFETs : role of border and semiconductor traps
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Influence of drain and gate potential on gate failure in semi-vertical GaN-on-Si trench MOSFETs
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Gate reliability of p-GaN power HEMTs under pulsed stress condition
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A defect characterization technique for the sidewall surface of Nano-ridge and Nanowire based Logic and RF technologies
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ON-state reliability of GaN-on-Si Schottky Barrier Diodes : Si3N4 vs. Al2O3/SiO2 GET dielectric
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Demonstration of bilayer gate insulator for improved reliability in GaN-on-Si vertical transistors
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Mu s-range evaluation of threshold voltage instabilities of GaN-on-Si HEMTs with p-GaN gate
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Perimeter driven transport in the p-GaN gate as a limiting factor for gate reliability