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ON-state reliability of GaN-on-Si Schottky Barrier Diodes : Si3N4 vs. Al2O3/SiO2 GET dielectric
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A defect characterization technique for the sidewall surface of Nano-ridge and Nanowire based Logic and RF technologies
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Demonstration of bilayer gate insulator for improved reliability in GaN-on-Si vertical transistors
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Mu s-range evaluation of threshold voltage instabilities of GaN-on-Si HEMTs with p-GaN gate
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A physical-statistical approach to AlGaN/GaN HEMT reliability
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Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors
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Perimeter driven transport in the p-GaN gate as a limiting factor for gate reliability
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On the origin of the leakage current in p-gate AlGaN/GaN HEMTs
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Failure mode for p-GaN gates under forward gate stress with varying Mg concentration
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Positive bias temperature instability evaluation in fully recessed gate GaN MIS-FETs