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Investigation on Carrier Transport Through AIN Nucleation Layer From Differently Doped Si(111) Substrates
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Reliability Improvements in AlGaN/GaN Schottky Barrier Diodes With a Gated Edge Termination
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Gate Conduction Mechanisms and Lifetime Modeling of p-Gate AlGaN/GaN High-Electron-Mobility Transistors
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Analytical Model for the Threshold Voltage of ${p}$ -(Al)GaN High-Electron-Mobility Transistors
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Toward understanding positive bias temperature instability in fully recessed-gate GaN MISFETs
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Statistical analysis of the impact of anode recess on the electrical characteristics of AlGaN/GaN Schottky diodes with gated edge termination
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Performance optimization of au-free lateral AlGaN/GaN Schottky barrier diode with gated edge termination on 200-mm silicon substrate
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TCAD Strain calibration versus nanobeam diffraction of source/drain stressors for Ge MOSFETs
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Polyimide-enhanced stretchable interconnects: design, fabrication, and characterization
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Analysis of a narrow-base lateral IGBT with double buried layer for junction-isolated smart-power technologies