Ghent University Academic Bibliography

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Compensating mode conversion due to bend discontinuities through intentional trace asymmetry

Xinglong Wu, Flavia Grassi, Paolo Manfredi (UGent) , Dries Vande Ginste (UGent) and Sergio A. Pignari

(2020) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 62(2). p.617-621
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Machine learning based error detection in transient susceptibility tests

Roberto Medico (UGent) , Niels Lambrecht (UGent) , Hugo Pues, Dries Vande Ginste (UGent) , Dirk Deschrijver (UGent) , Tom Dhaene (UGent) and Domenico Spina (UGent)

(2019) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 61(2). p.352-360
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- Journal Article
- A1
- open access
Generation of stochastic interconnect responses via gaussian process latent variable models

Simon De Ridder (UGent) , Dirk Deschrijver (UGent) , Paolo Manfredi (UGent) , Tom Dhaene (UGent) and Dries Vande Ginste (UGent)

(2019) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 61(2). p.582-585
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Brain cortical stimulation thresholds to different magnetic field sources exposures at intermediate frequencies

Jose Gomez-Tames, Thomas Tarnaud (UGent) , Keishi Miwa, Akimasa Hirata, Tom Van de Steene (UGent) , Luc Martens (UGent) , Emmeric Tanghe (UGent) and Wout Joseph (UGent)

(2019) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 61(6). p.1944-1952
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Perturbative analysis of differential-to-common mode conversion in asymmetric nonuniform interconnects

Xinglong Wu, Flavia Grassi, Paolo Manfredi (UGent) and Dries Vande Ginste (UGent)

(2018) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 60(1). p.7-15
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A circuit modeling technique for the ISO 7637-3 capacitive coupling clamp test

Niels Lambrecht (UGent) , H. Pues, Daniël De Zutter (UGent) and Dries Vande Ginste (UGent)

(2018) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 60(4). p.858-865
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Comprehensive and modular stochastic modeling framework for the variability-aware assessment of Signal Integrity in high-speed links

Yinghao Ye (UGent) , Domenico Spina (UGent) , Paolo Manfredi (UGent) , Dries Vande Ginste (UGent) and Tom Dhaene (UGent)

(2018) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 60(2). p.459-467
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- Journal Article
- A1
- open access
Modeling of contact bounce in a transient electromagnetic compatibility test for the analysis and optimization of nonlinear devices

Niels Lambrecht (UGent) , H Pues, Daniël De Zutter (UGent) and Dries Vande Ginste (UGent)

(2017) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 59(2). p.541-544
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Effects of undesired asymmetries and nonuniformities in differential lines

Flavia Grassi, Paolo Manfredi (UGent) , Xiaokang Liu, Jingkai Sun, Xinglong Wu, Dries Vande Ginste (UGent) and Sergio A. Pignari

(2017) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 59(5). p.1613-1624
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Efficient circuit modeling technique for the analysis and optimization of ISO 10605 field coupled Electrostatic Discharge (ESD) robustness of nonlinear devices

Niels Lambrecht (UGent) , C. Gazda, H. Pues, Daniël De Zutter (UGent) and Dries Vande Ginste (UGent)

(2016) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 58(4). p.971-980

Academic Bibliography

Compensating mode conversion due to bend discontinuities through intentional trace asymmetry

Machine learning based error detection in transient susceptibility tests

Generation of stochastic interconnect responses via gaussian process latent variable models

Brain cortical stimulation thresholds to different magnetic field sources exposures at intermediate frequencies

Perturbative analysis of differential-to-common mode conversion in asymmetric nonuniform interconnects

A circuit modeling technique for the ISO 7637-3 capacitive coupling clamp test

Comprehensive and modular stochastic modeling framework for the variability-aware assessment of Signal Integrity in high-speed links

Modeling of contact bounce in a transient electromagnetic compatibility test for the analysis and optimization of nonlinear devices

Effects of undesired asymmetries and nonuniformities in differential lines

Efficient circuit modeling technique for the analysis and optimization of ISO 10605 field coupled Electrostatic Discharge (ESD) robustness of nonlinear devices

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