Ghent University Academic Bibliography

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Generation of Stochastic Interconnect Responses via Gaussian Process Latent Variable Models

Simon De Ridder (UGent) , Dirk Deschrijver (UGent) , Paolo Manfredi (UGent) , Tom Dhaene (UGent) and Dries Vande Ginste (UGent)

(2019) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 61(2). p.582-585
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Machine Learning Based Error Detection in Transient Susceptibility Tests

Roberto Medico (UGent) , Niels Lambrecht (UGent) , Hugo Pues, Dries Vande Ginste (UGent) , Dirk Deschrijver (UGent) , Tom Dhaene (UGent) and Domenico Spina (UGent)

(2019) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 61(2). p.352-360
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Comprehensive and modular stochastic modeling framework for the variability-aware assessment of Signal Integrity in high-speed links

Yinghao Ye (UGent) , Domenico Spina (UGent) , Paolo Manfredi (UGent) , Dries Vande Ginste (UGent) and Tom Dhaene (UGent)

(2018) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 60(2). p.459-467
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Perturbative analysis of differential-to-common mode conversion in asymmetric nonuniform interconnects

Xinglong Wu, Flavia Grassi, Paolo Manfredi (UGent) and Dries Vande Ginste (UGent)

(2018) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 60(1). p.7-15
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A circuit modeling technique for the ISO 7637-3 capacitive coupling clamp test

Niels Lambrecht (UGent) , H. Pues, Daniël De Zutter (UGent) and Dries Vande Ginste (UGent)

(2018) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 60(4). p.858-865
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Modeling of contact bounce in a transient electromagnetic compatibility test for the analysis and optimization of nonlinear devices

Niels Lambrecht (UGent) , H Pues, Daniël De Zutter (UGent) and Dries Vande Ginste (UGent)

(2017) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 59(2). p.541-544
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Effects of undesired asymmetries and nonuniformities in differential lines

Flavia Grassi, Paolo Manfredi (UGent) , Xiaokang Liu, Jingkai Sun, Xinglong Wu, Dries Vande Ginste (UGent) and Sergio A. Pignari

(2017) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 59(5). p.1613-1624
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Efficient circuit modeling technique for the analysis and optimization of ISO 10605 field coupled Electrostatic Discharge (ESD) robustness of nonlinear devices

Niels Lambrecht (UGent) , C. Gazda, H. Pues, Daniël De Zutter (UGent) and Dries Vande Ginste (UGent)

(2016) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 58(4). p.971-980
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Full-wave modeling of interacting multiport devices with arbitrary relative positions and orientations for efficient EMI assessment

Gert-Jan Stockman (UGent) , Sam Lemey (UGent) , Hendrik Rogier (UGent) and Dries Vande Ginste (UGent)

(2016) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 58(4). p.1322-1330
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Analysis of nonuniform transmission lines with an iterative and adaptive perturbation technique

Paolo Manfredi (UGent) , Daniël De Zutter (UGent) and Dries Vande Ginste (UGent)

(2016) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 58(3). p.859-867

Academic Bibliography

Generation of Stochastic Interconnect Responses via Gaussian Process Latent Variable Models

Machine Learning Based Error Detection in Transient Susceptibility Tests

Comprehensive and modular stochastic modeling framework for the variability-aware assessment of Signal Integrity in high-speed links

Perturbative analysis of differential-to-common mode conversion in asymmetric nonuniform interconnects

A circuit modeling technique for the ISO 7637-3 capacitive coupling clamp test

Modeling of contact bounce in a transient electromagnetic compatibility test for the analysis and optimization of nonlinear devices

Effects of undesired asymmetries and nonuniformities in differential lines

Efficient circuit modeling technique for the analysis and optimization of ISO 10605 field coupled Electrostatic Discharge (ESD) robustness of nonlinear devices

Full-wave modeling of interacting multiport devices with arbitrary relative positions and orientations for efficient EMI assessment

Analysis of nonuniform transmission lines with an iterative and adaptive perturbation technique

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