Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: parent exact "IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY" Add to list Journal Article A1 Impact of structural and process variations on the time-dependent OFF-state breakdown of p-GaN power HEMTs M. Millesimo, N. Posthuma, Benoit Bakeroot (UGent) , M. Borga, S. Decoutere and A. N. Tallarico (2021) IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY. 21(1). p.57-63 Add to list Journal Article A1 Schottky gate induced threshold voltage instabilities in p-GaN gate AlGaN/GaN HEMTs Arno Stockman, Eleonora Canato, Matteo Meneghini, Gaudenzio Meneghesso, Peter Moens and Benoit Bakeroot (UGent) (2021) IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY. 21(2). p.169-175 Add to list Journal Article A2 Reliability analysis for power devices which undego fast thermal cycling D Simon, Gilbert De Mey (UGent) , V Topa and G Spitzer (2016) IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY. 16. p.336-344