Ghent University Academic Bibliography

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Variability analysis of a boost converter based on an iterative and decoupled circuit implementation of the stochastic Galerkin method

Paolo Manfredi (UGent) , Riccardo Trinchero and Dries Vande Ginste (UGent)

(2018) 2018 JOINT IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY AND 2018 IEEE ASIA-PACIFIC SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC/APEMC). In IEEE International Symposium on Electromagnetic Compatibility p.996-1000
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Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test

Niels Lambrecht (UGent) , Daniël De Zutter (UGent) , Dries Vande Ginste (UGent) and Hugo Pues

(2017) 2017 INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY - EMC EUROPE. In IEEE International Symposium on Electromagnetic Compatibility p.1-5
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- P1
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Stochastic macromodeling for hierarchical uncertainty quantification of nonlinear electronic systems

Domenico Spina (UGent) , D De Jonghe, Francesco Ferranti (UGent) , G Gielen, Tom Dhaene (UGent) , Luc Knockaert (UGent) and G Antonini

(2015) IEEE International Symposium on Electromagnetic Compatibility. p.1335-1338
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- P1
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Efficient full-wave modeling of radiative near-field interactions in semi-anechoic conditions

Gert-Jan Stockman (UGent) , Hendrik Rogier (UGent) and Dries Vande Ginste (UGent)

(2015) IEEE International Symposium on Electromagnetic Compatibility. p.524-528
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Sequential sampling algorithm for simultaneous near-field scanning of amplitude and phase

T Claeys, D Pissoort, Dirk Deschrijver (UGent) , Ivo Couckuyt (UGent) and Tom Dhaene (UGent)

(2014) IEEE International Symposium on Electromagnetic Compatibility. p.79-84
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- Conference Paper
- C3
- open access
Parameterized models for efficient design in EMC and SI applications

Francesco Ferranti (UGent) , Tom Dhaene (UGent) , Luc Knockaert (UGent) , G Antonini and A Ciccomancini Scogna

(2012) IEEE International Symposium on Electromagnetic Compatibility. p.1-7
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Analysis of common-mode noise on on-chip differential lines through stochastic modeling of parameter variability

Dries Vande Ginste (UGent) , Daniël De Zutter (UGent) , Dirk Deschrijver (UGent) , Tom Dhaene (UGent) , Paolo Manfredi and Flavio Canavero

(2012) IEEE International Symposium on Electromagnetic Compatibility. p.144-149
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Parameterized models for crosstalk analysis in high-speed interconnects

Francesco Ferranti (UGent) , Tom Dhaene (UGent) , Luc Knockaert (UGent) and G Antonini

(2009) IEEE International Symposium on Electromagnetic Compatibility. p.180-185

Academic Bibliography

Variability analysis of a boost converter based on an iterative and decoupled circuit implementation of the stochastic Galerkin method

Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test

Stochastic macromodeling for hierarchical uncertainty quantification of nonlinear electronic systems

Efficient full-wave modeling of radiative near-field interactions in semi-anechoic conditions

Sequential sampling algorithm for simultaneous near-field scanning of amplitude and phase

Parameterized models for efficient design in EMC and SI applications

Analysis of common-mode noise on on-chip differential lines through stochastic modeling of parameter variability

Parameterized models for crosstalk analysis in high-speed interconnects

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