Ghent University Academic Bibliography

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Composition optimization and device understanding of Si-Ge-As-Te ovonic threshold switch selector with excellent endurance

D. Garbin, W. Devulder, R. Degraeve, G. L. Donadio, S. Clima, K. Opsomer, A. Fantini, D. Cellier, W. G. Kim, M. Pakala, et al.

(2019) 2019 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM). In IEEE International Electron Devices Meeting p.35.1.1-35.1.4
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2D-3D integration of high-kappa dielectric with 2D heterostructures for opto-electronic applications

B. Terres, H. Agarwal, L. Orsini, A. Montanaro, V. Sorianello, Dries Van Thourhout (UGent) , K. Watanabe, T. Taniguchi, M. Romagnoli and F. H. L. Koppens

(2019) 2019 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM). In IEEE International Electron Devices Meeting p.33.5.1-33.5.4
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GaN-on-SOI : monolithically integrated All-GaN ICs for power conversion

X. Li, N; Amirifar, K. Geens, M. Zhao, W. Guo, H. Liang, S. You, N. Posthuma, B. De Jaeger, S. Stoffels, et al.

(2019) 2019 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM). In IEEE International Electron Devices Meeting
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- Conference Paper
- P1
- open access
Non-filamentary (VMCO) memory : a two- and three-dimensional study on switching and failure modes

U Celano, C Gastaldi, S Subhechha, B Govoreanu, G Donadio, A Franquet, T Ahmad, Christophe Detavernier (UGent) , O Richard, H Bender, et al.

(2017) 2017 IEEE international electron devices meeting (IEDM). In IEEE International Electron Devices Meeting
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Total suppression of dynamic-ron in AlGaN/GaN-HEMTs through proton irradiation

M. Meneghini, A. Tajalli, P. Moens, A. Baneree, Arno Stockman (UGent) , M. Tack, S. Gerardin, M. Bagatin, A. Paccagnella, E. Zanoni, et al.

(2017) 2017 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM). In IEEE International Electron Devices Meeting
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- Conference Paper
- P1
- open access
Reliable 50Gb/s silicon photonics platform for next-generation data center optical interconnects

P. Absil, K. Croes, A. Lesniewska, P. De Heyn, Y. Ban, B. Snyder, J. De Coster, F. Fodor, V. Simons, S. Balakrishnan, et al.

(2017) 2017 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM). In IEEE International Electron Devices Meeting
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An active artificial iris controlled by a 25-mu W flexible thin-film driver

Florian De Roose, Soeren Steudel, Kris Myny, Myriam Willegems, Steve Smout, Marc Ameys, Pawel E Malinowski, Robert Gehlhaar, Radhika Kallidil Poduval, Xinyu Chen, et al.

(2016) IEEE International Electron Devices Meeting. In IEEE International Electron Devices Meeting
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- Conference Paper
- P1
Design and fabrication of a biomedical Lab-on-Chip system for SNP detection in DNA

Maaike Op de Beeck (UGent) , W. De Malsche, M. Hiraoka, P. Fiorini, L. Zhang, J. Op De Beeck, B. Majeed, H. Tanaka, D. Sabuncuoglu Tezcan, G. Desmet, et al.

(2010) 2010 INTERNATIONAL ELECTRON DEVICES MEETING - TECHNICAL DIGEST. In IEEE International Electron Devices Meeting

Academic Bibliography

Composition optimization and device understanding of Si-Ge-As-Te ovonic threshold switch selector with excellent endurance

2D-3D integration of high-kappa dielectric with 2D heterostructures for opto-electronic applications

GaN-on-SOI : monolithically integrated All-GaN ICs for power conversion

Non-filamentary (VMCO) memory : a two- and three-dimensional study on switching and failure modes

Total suppression of dynamic-ron in AlGaN/GaN-HEMTs through proton irradiation

Reliable 50Gb/s silicon photonics platform for next-generation data center optical interconnects

An active artificial iris controlled by a 25-mu W flexible thin-film driver

Design and fabrication of a biomedical Lab-on-Chip system for SNP detection in DNA

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