Ghent University Academic Bibliography

Your filters: cql: parent exact "ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY"

Add to list
A deep level transient spectroscopy study of hole traps in GexSe1-x-based layers for ovonic threshold switching selectors

P.-C. Hsu, Eddy Simoen (UGent) , D. Lin, A. Stesmans, L. Goux, R. Delhougne, P. Carolan, H. Bender and G. S. Kar

(2020) ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY. 9(4).
Add to list
Electrical activity of extended defects in relaxed InxGa1−xAs hetero-epitaxial layers

C. Claeys, P.-C. Hsu, Y. Mols, H. Han, H. Bender, F. Seidel, P. Carolan, C. Merckling, A. Alian, N. Waldron, et al.

(2020) ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY. 9(3).
Add to list
- Journal Article
- A1
- open access
Low-frequency noise assessment of work function engineering cap layers in high-k gate stacks

C Claeys, R Ritzenthaler, T Schram, H Arimura, N Horiguchi and Eddy Simoen (UGent)

(2019) ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY. 8(2). p.N25-N31
Add to list
- Journal Article
- A1
- open access
On the evolution of strain and electrical properties in As-grown and annealed Si:P epitaxial films for source-drain stressor applications

Sathish kumar Dhayalan, Jiri Kujala, Jonatan Slotte, Geoffrey Pourtois, Eddy Simoen (UGent) , Erik Rosseel, Andriy Hikavyy, Yosuke Shimura, Roger Loo and Wilfried Vandervorst

(2018) ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY. 7(5). p.P228-P237
Add to list
Non-isothermal modeling of dark current-voltage measurements of a CIGS solar cell

Ana Obradović (UGent) , Kenneth Toch (UGent) , Bert Coppens, Samira Khelifi (UGent) , Johan Lauwaert (UGent) and Joris Thybaut (UGent)

(2018) ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY. 7(2). p.50-54
Add to list
- Journal Article
- A1
- open access
Deep level assessment of n-type Si/SiO2 metal-oxide-semiconductor capacitors with embedded Ge quantum dots

M Aouassa, Henk Vrielinck (UGent) and Eddy Simoen (UGent)

(2018) ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY. 7(2). p.P24-P28
Add to list
- Journal Article
- A1
- open access
Microscopic study of dopant distribution in europium doped SrGa2S4 : impact on thermal quenching and phosphor performance

Lisa Martin (UGent) , Dirk Poelman (UGent) , Philippe Smet (UGent) and Jonas Joos (UGent)

(2018) ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY. 7(1). p.R3052-R3056
Add to list
- Journal Article
- A1
- open access
Local, temperature-dependent trapping and detrapping in the LiGa5O8:Cr infrared emitting persistent phosphor

Olivier De Clercq and Dirk Poelman (UGent)

(2018) ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY. 7(1). p.R3171-R3175
Add to list
Transfer printing of micron-size graphene for photonic integrated circuits and devices

Leili Abdollahi Shiramin (UGent) , Alexandre Bazin (UGent) , Steven Verstuyft (UGent) , Sylvia Lycke (UGent) , Peter Vandenabeele (UGent) , Günther Roelkens (UGent) and Dries Van Thourhout (UGent)

(2017) ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY. 6(7). p.435-439
Add to list
- Journal Article
- A1
- open access
Carbon-related defects in Si:C/silicon heterostructures assessed by deep-level transient spectroscopy

Eddy Simoen (UGent) , SK Dhayalan, A Hikavyy, R Loo, E Rosseel, Henk Vrielinck (UGent) and Johan Lauwaert (UGent)

(2017) ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY. 6(5). p.P284-P289

Academic Bibliography

A deep level transient spectroscopy study of hole traps in GexSe1-x-based layers for ovonic threshold switching selectors

Electrical activity of extended defects in relaxed InxGa1−xAs hetero-epitaxial layers

Low-frequency noise assessment of work function engineering cap layers in high-k gate stacks

On the evolution of strain and electrical properties in As-grown and annealed Si:P epitaxial films for source-drain stressor applications

Non-isothermal modeling of dark current-voltage measurements of a CIGS solar cell

Deep level assessment of n-type Si/SiO2 metal-oxide-semiconductor capacitors with embedded Ge quantum dots

Microscopic study of dopant distribution in europium doped SrGa2S4 : impact on thermal quenching and phosphor performance

Local, temperature-dependent trapping and detrapping in the LiGa5O8:Cr infrared emitting persistent phosphor

Transfer printing of micron-size graphene for photonic integrated circuits and devices

Carbon-related defects in Si:C/silicon heterostructures assessed by deep-level transient spectroscopy

Contents

Support

Contact