Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: parent exact "Defects and diffusion semiconductors : an annual retrospective IX" Add to list Book Chapter Defect analysis in semiconductor materials based on p-n junction diode characteristics Eddy Simoen (UGent) , Cor Claeys and Jan Vanhellemont (UGent) (2007) Defects and diffusion semiconductors : an annual retrospective IX. In Defect and Diffusion Forum 261-262. p.1-24