Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: parent exact "2022 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)" Add to list Conference Paper P1 Gate reliability of p-GaN power HEMTs under pulsed stress condition M. Millesimo, Benoit Bakeroot (UGent) , M. Borga, N. Posthuma, S. Decoutere, E. Sangiorgi, C. Fiegna and A. N. Tallarico (2022) 2022 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). In International Reliability Physics Symposium p.10B.2-1-10B.2-6 Add to list Conference Paper P1 Influence of drain and gate potential on gate failure in semi-vertical GaN-on-Si trench MOSFETs D. Favero, C. De Santi, K. Mukherjee, K. Geens, M. Borga, Benoit Bakeroot (UGent) , S. You, S. Decoutere, G. Meneghesso, E. Zanoni, et al. (2022) 2022 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). In International Reliability Physics Symposium