Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Save this search Download search results Subscribe to news feed Your filters: cql: parent exact "2018 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)" Add to list Conference Paper P1 On the origin of the leakage current in p-gate AlGaN/GaN HEMTs Arno Stockman (UGent) , E. Canato, A. Tajalli, M. Meneghini, G. Meneghesso, E. Zanoni, P. Moens and Benoit Bakeroot (UGent) (2018) 2018 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). In International Reliability Physics Symposium p.4B.5-1-4B.5-4