Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: parent exact "2018 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)" Add to list Conference Paper P1 On the origin of the leakage current in p-gate AlGaN/GaN HEMTs Arno Stockman, E. Canato, A. Tajalli, M. Meneghini, G. Meneghesso, E. Zanoni, P. Moens and Benoit Bakeroot (UGent) (2018) 2018 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). In International Reliability Physics Symposium p.4B.5-1-4B.5-4