Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: parent exact "2017 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)" Add to list Conference Paper P1 Failure mode for p-GaN gates under forward gate stress with varying Mg concentration S. Stoffels, B. Bakeroot, T. L. Wu, D. Marcon, N. E. Posthuma, S. Decoutere, A. N. Tallarico and C. Fiegna (2017) 2017 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). In International Reliability Physics Symposium