Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: keyword exact "transistor" cql: author exact 002003173470 or (type exact bookEditor and editor exact 002003173470) Add to list Journal Article A1 High-throughput screening of extrinsic point defect properties in Si and Ge : database and applications Michael Sluydts (UGent) , Michaƫl Pieters, Jan Vanhellemont (UGent) , Veronique Van Speybroeck (UGent) and Stefaan Cottenier (UGent) (2017) CHEMISTRY OF MATERIALS. 29(3). p.975-984