Ghent University Academic Bibliography

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Fast characterization of input-output behavior of non-charge-based logic devices by machine learning

Arun Kaintura (UGent) , Kyle Powers Foss (UGent) , Odysseas Zografos, Ivo Couckuyt (UGent) , Adrien Vaysset, Tom Dhaene (UGent) and Bart Soree

(2020) ELECTRONICS. 9(9).
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Efficient generation of X-parameters transistor models by sequential sampling

Pawel Barmuta, Francesco Ferranti (UGent) , Arkadiusz Lewandowski, Luc Knockaert (UGent) and Dominique Schreurs

(2014) IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS. 24(8). p.530-532
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Scalable models of microwave system responses using sequential sampling on unstructured grids

Krishnan Chemmangat Manakkal Cheriya (UGent) , Francesco Ferranti (UGent) , Tom Dhaene (UGent) and Luc Knockaert (UGent)

(2014) INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS. 27(1). p.122-137
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Accurate hotspot localization by sampling the near-field pattern of electronic devices

Prashant Singh (UGent) , Dirk Deschrijver (UGent) , Davy Pissoort and Tom Dhaene (UGent)

(2013) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 55(6). p.1365-1368
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Automated near-field scanning algorithm for the EMC analysis of electronic devices

Dirk Deschrijver (UGent) , Filip Vanhee, Davy Pissoort and Tom Dhaene (UGent)

(2012) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 54(3). p.502-510

Academic Bibliography

Fast characterization of input-output behavior of non-charge-based logic devices by machine learning

Efficient generation of X-parameters transistor models by sequential sampling

Scalable models of microwave system responses using sequential sampling on unstructured grids

Accurate hotspot localization by sampling the near-field pattern of electronic devices

Automated near-field scanning algorithm for the EMC analysis of electronic devices

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