Ghent University Academic Bibliography

Your filters: cql: keyword exact "low-frequency noise"

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Refined analysis of the correlated carrier number and mobility fluctuations mechanism in MOSFETs

Bogdan Cretu, Abderrahim Tahiat, Anabela Veloso and Eddy Simoen (UGent)

(2024) IEEE TRANSACTIONS ON ELECTRON DEVICES. 71(10). p.5860-5866
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Impact of the channel doping on the low-frequency noise of gate-all-around silicon vertical nanowire pMOSFETs

Eddy Simoen (UGent) , Anabela Veloso, Philippe Matagne and Cor Claeys

(2023) SOLID-STATE ELECTRONICS. 200.
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Refined DC and low-frequency noise characterization at room and cryogenic temperatures of vertically stacked silicon nanosheet FETs

Bogdan Cretu, Anabela Veloso and Eddy Simoen (UGent)

(2023) IEEE TRANSACTIONS ON ELECTRON DEVICES. 70(1). p.254-260
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3D backside integration of FinFETs : is there an impact on LF noise?

Eddy Simoen (UGent) , Anne Jourdain, Cor Claeys and Anabela Veloso

(2023) SOLID-STATE ELECTRONICS. 207.
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Correlating traffic data, spectral noise and air pollution measurements : retrospective analysis of simultaneous measurements near a highway in the Netherlands

Luc Dekoninck (UGent) and Marcel Severijnen

(2022) ATMOSPHERE. 13(5).
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Performance perspective of Gate-All-Around double nanosheet CMOS beyond high-speed logic applications

Eddy Simoen (UGent) , Carlos H.S. Coelho, Vanessa C.P. da Silva, João A. Martino, Paula Ghedini Der Agopian, Alberto Oliveira, Bogdan Cretu and Anabela Veloso

(2022) JOURNAL OF INTEGRATED CIRCUITS AND SYSTEMS. 17(2).
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Interfacial properties of nMOSFETs with different Al2O3 capping layer thickness and TiN gate stacks

Danghui Wang, Tianhan Xu, Eddy Simoen (UGent) , Bogdan Govoreanu, Cor Claeys and Yang Zhang

(2021) IEEE TRANSACTIONS ON ELECTRON DEVICES. 68(3). p.948-953
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Low temperature investigation of n-channel GAA vertically stacked silicon nanosheets

Bogdan Cretu, Anabela Veloso and Eddy Simoen (UGent)

(2021) 2021 JOINT INTERNATIONAL EUROSOI WORKSHOP AND INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION ON SILICON (EUROSOI-ULIS). In International Conference on Ultimate Integration on Silicon
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Device performance as a metrology tool to detect metals in silicon

Cor Claeys and Eddy Simoen (UGent)

(2019) PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE. 216(17).
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Community response to multiple sound sources : integrating acoustic and contextual approaches in the analysis

Peter Lercher, Bert De Coensel (UGent) , Luc Dekoninck (UGent) and Dick Botteldooren (UGent)

(2017) INTERNATIONAL JOURNAL OF ENVIRONMENTAL RESEARCH AND PUBLIC HEALTH. 14(6).

Academic Bibliography

Refined analysis of the correlated carrier number and mobility fluctuations mechanism in MOSFETs

Impact of the channel doping on the low-frequency noise of gate-all-around silicon vertical nanowire pMOSFETs

Refined DC and low-frequency noise characterization at room and cryogenic temperatures of vertically stacked silicon nanosheet FETs

3D backside integration of FinFETs : is there an impact on LF noise?

Correlating traffic data, spectral noise and air pollution measurements : retrospective analysis of simultaneous measurements near a highway in the Netherlands

Performance perspective of Gate-All-Around double nanosheet CMOS beyond high-speed logic applications

Interfacial properties of nMOSFETs with different Al2O3 capping layer thickness and TiN gate stacks

Low temperature investigation of n-channel GAA vertically stacked silicon nanosheets

Device performance as a metrology tool to detect metals in silicon

Community response to multiple sound sources : integrating acoustic and contextual approaches in the analysis

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