Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: keyword exact "impurities" cql: author exact 801000299040 or (type exact bookEditor and editor exact 801000299040) Add to list Journal Article A1 open access Direct estimation of capture cross sections in the presence of slow capture: application to the identification of quenched-in deeplevel defects in Ge Siegfried Segers (UGent) , Johan Lauwaert (UGent) , Paul Clauws (UGent) , Eddy Simoen (UGent) , Jan Vanhellemont (UGent) , Freddy Callens (UGent) and Henk Vrielinck (UGent) (2014) SEMICONDUCTOR SCIENCE AND TECHNOLOGY. 29(12). Add to list Journal Article A1 open access Temperature-independent slow carrier emission from deep-level defects in p-type germanium Siegfried Segers (UGent) , Johan Lauwaert (UGent) , Paul Clauws (UGent) , Eddy Simoen, Jan Vanhellemont (UGent) , Freddy Callens (UGent) and Henk Vrielinck (UGent) (2013) JOURNAL OF PHYSICS D-APPLIED PHYSICS. 46(42).