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Modeling gate leakage current for p-GaN gate HEMTs with engineered doping profile
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Extending electrostatic modeling for Schottky p-GaN gate HEMTs : uniform and engineered p-GaN doping
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Frontiers in low-frequency noise research in advanced semiconductor devices
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Impact of structural and process variations on the time-dependent OFF-state breakdown of p-GaN power HEMTs
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- Journal Article
- A1
- open access
Heterogeneous integration and precise alignment of InP-based photonic crystal lasers to complementary metal-oxide semiconductor fabricated silicon-on-insulator wire waveguides