Ghent University Academic Bibliography

A machine learning-based epistemic modeling framework for EMC and SI assessment

Duygu De Witte, Simon De Ridder, Domenico Spina (UGent) , Tom Dhaene (UGent) , Hendrik Rogier (UGent) , Dries Vande Ginste (UGent) and Flavia Grassi

(2020) 2020 IEEE 24th Workshop on Signal and Power Integrity (SPI), Proceedings. In IEEE Workshop on Signal and Power Integrity

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Uncertainty quantification of waveguide dispersion using sparse grid stochastic testing

Michiel Gossye, Gert-Jan Gordebeke (UGent) , Kamil Yavuz Kapusuz (UGent) , Dries Vande Ginste (UGent) and Hendrik Rogier (UGent)

(2020) IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. 68(7). p.2485-2494

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Journal Article
A1
open access

Machine-learning-based hybrid random-fuzzy uncertainty quantification for EMC and SI assessment

Simon De Ridder, Domenico Spina (UGent) , Nicola Toscani, Flavia Grassi, Dries Vande Ginste (UGent) and Tom Dhaene (UGent)

(2020) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 62(6). p.2538-2546

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Journal Article
A1
open access

A perturbative stochastic Galerkin method for the uncertainty quantification of linear circuits

Paolo Manfredi (UGent) , Riccardo Trinchero and Dries Vande Ginste (UGent)

(2020) IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS. 67(9). p.2993-3006

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Conference Paper
P1
open access

Parameterized macromodeling of stochastic linear systems for frequency- and time-domain variability analysis

Yinghao Ye, Domenico Spina (UGent) , G. Antonini and Tom Dhaene (UGent)

(2018) 2018 IEEE 22ND WORKSHOP ON SIGNAL AND POWER INTEGRITY (SPI). In IEEE Workshop on Signal and Power Integrity p.1-4

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Journal Article
A1
open access

Review of polynomial chaos-based methods for uncertainty quantification in modern integrated circuits

Arun Kaintura, Tom Dhaene (UGent) and Domenico Spina (UGent)

(2018) ELECTRONICS. 7(3).

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Conference Paper
P1
open access

Time-domain variability analysis of general linear systems terminated with nonlinear devices

Yinghao Ye, Domenico Spina (UGent) , Paolo Manfredi (UGent) , Dries Vande Ginste (UGent) and Tom Dhaene (UGent)

(2017) 2017 IEEE 21ST WORKSHOP ON SIGNAL AND POWER INTEGRITY (SPI). In IEEE Workshop on Signal and Power Integrity p.1-4

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Journal Article
A1
open access

A Kriging and stochastic collocation ensemble for uncertainty quantification in engineering applications

Arun Kaintura, Domenico Spina (UGent) , Ivo Couckuyt (UGent) , Luc Knockaert (UGent) , Wim Bogaerts (UGent) and Tom Dhaene (UGent)

(2017) ENGINEERING WITH COMPUTERS. 33(4). p.935-949

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Stochastic analysis of the impact of substrate compression on the performance of textile antennas

Marco Rossi (UGent) , Sam Agneessens (UGent) , Hendrik Rogier (UGent) and Dries Vande Ginste (UGent)

(2016) IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION. 64(6). p.2507-2512

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Journal Article
A1
open access

Combined parametric and worst case circuit analysis via Taylor models

R Trinchero, Paolo Manfredi (UGent) , TY Ding and IS Stievano

(2016) IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS. 63(7). p.1067-1078

Academic Bibliography

A machine learning-based epistemic modeling framework for EMC and SI assessment

Uncertainty quantification of waveguide dispersion using sparse grid stochastic testing

Machine-learning-based hybrid random-fuzzy uncertainty quantification for EMC and SI assessment

A perturbative stochastic Galerkin method for the uncertainty quantification of linear circuits

Parameterized macromodeling of stochastic linear systems for frequency- and time-domain variability analysis

Review of polynomial chaos-based methods for uncertainty quantification in modern integrated circuits

Time-domain variability analysis of general linear systems terminated with nonlinear devices

A Kriging and stochastic collocation ensemble for uncertainty quantification in engineering applications

Stochastic analysis of the impact of substrate compression on the performance of textile antennas

Combined parametric and worst case circuit analysis via Taylor models

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