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Novel Y-function methodology parameter estimation from weak to strong inversion operation
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- Journal Article
- A1
- open access
Refined DC and low-frequency noise characterization at room and cryogenic temperatures of vertically stacked silicon nanosheet FETs
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- Journal Article
- A1
- open access
Is there a limit when the access resistance impact on the extraction of key GAA NS FETs devices parameters can (not) be avoided?
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Determining thermal simulation data from transient measurements