Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Save this search Download search results Subscribe to news feed Your filters: cql: keyword exact "Electromagnetic compatibility (EMC)" Add to list Journal Article A1 Machine learning based error detection in transient susceptibility tests Roberto Medico (UGent) , Niels Lambrecht (UGent) , Hugo Pues, Dries Vande Ginste (UGent) , Dirk Deschrijver (UGent) , Tom Dhaene (UGent) and Domenico Spina (UGent) (2019) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 61(2). p.352-360 Add to list Journal Article A1 open access Automated near-field scanning algorithm for the EMC analysis of electronic devices Dirk Deschrijver (UGent) , Filip Vanhee, Davy Pissoort and Tom Dhaene (UGent) (2012) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 54(3). p.502-510