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Academic Bibliography

Search 200 years of publications by Ghent University researchers.

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1 – 5 of 5 publications

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Your filters: cql: keyword exact "1/F NOISE"

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- Journal Article
- A1
- open access
Refined analysis of the correlated carrier number and mobility fluctuations mechanism in MOSFETs

Bogdan Cretu, Abderrahim Tahiat, Anabela Veloso and Eddy Simoen (UGent)

(2024) IEEE TRANSACTIONS ON ELECTRON DEVICES. 71(10). p.5860-5866
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- Journal Article
- A1
- open access
Refined DC and low-frequency noise characterization at room and cryogenic temperatures of vertically stacked silicon nanosheet FETs

Bogdan Cretu, Anabela Veloso and Eddy Simoen (UGent)

(2023) IEEE TRANSACTIONS ON ELECTRON DEVICES. 70(1). p.254-260
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Frontiers in low-frequency noise research in advanced semiconductor devices

Eddy Simoen (UGent) , Anabela Veloso, Barry O'Sullivan, Kenichiro Takakura and Cor Claeys

(2021) 2021 China Semiconductor Technology International Conference (CSTIC).
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Low temperature investigation of n-channel GAA vertically stacked silicon nanosheets

Bogdan Cretu, Anabela Veloso and Eddy Simoen (UGent)

(2021) 2021 JOINT INTERNATIONAL EUROSOI WORKSHOP AND INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION ON SILICON (EUROSOI-ULIS). In International Conference on Ultimate Integration on Silicon
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Gate metal and cap layer effects on Ge nMOSFETs low-frequency noise behavior

Liang He, Pan Zhao, Jiahao Liu, Yahui Su, Hua Chen, Xiaofei Jia, Hiroaki Arimura, Jerome Mitard, Liesbet Witters, Naoto Horiguchi, et al.

(2019) IEEE TRANSACTIONS ON ELECTRON DEVICES. 66(2). p.1050-1056

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