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- 2016
- Pigment particles analysis with a total reflection X-ray fluorescence spectrometer : study of influence of instrumental parameters
- Carrier lifetime spectroscopy for defect characterization in semiconductor materials and devices
- Luminescent behavior of the K2SiF6:Mn4+ red phosphor at high fluxes and at the microscopic level
- Dark current analysis in high-speed germanium p-i-n waveguide photodetectors
- Grating couplers with an integrated power splitter for high-intensity optical power distribution
- Design requirements for group-IV laser based on fully strained Ge1-xSnx embedded in partially relaxed Si1-y-zGeySnz buffer layers
- Phase formation and texture of thin nickel germanides on Ge(001) and Ge(111)
- Anisotropic thermal expansion of Ni, Pd and Pt germanides and silicides
- The effect of Dzyaloshinskii-Moriya interaction on field-driven domain wall dynamics analysed by a semi-analytical approach
- Sputter deposition of Ce(Sm,Y)O2 thin films : linking phase instability to grain size