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TCAD Modeling of the Dynamic VTH Hysteresis Under Fast Sweeping Characterization in p-GaN Gate HEMTs
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NH<sub>3</sub> PDA Temperature-Impact on Low-Frequency Noise Behavior of Si<sub>0.7</sub>Ge<sub>0.3</sub> pFinFETs
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Compact Modeling of Nonideal Trapping/Detrapping Processes in GaN Power Devices
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Reliability of p-GaN gate HEMTs in reverse conduction
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High-temperature time-dependent gate breakdown of p-GaN HEMTs
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Interfacial properties of nMOSFETs with different Al2O3 capping layer thickness and TiN gate stacks
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Impact of dummy gate removal and a silicon cap on the low-frequency noise performance of germanium nFinFETs
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Investigation of defect characteristics and carrier transport mechanisms in GaN layers with different carbon doping concentration
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- Journal Article
- A1
- open access
Surface-potential-based compact model for the gate current of p-GaN Gate HEMTs
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Modeling of the vertical leakage current in AlN/Si heterojunctions for GaN power applications