Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions News feed Embed this list Save this search Mark all Export Your filters: cql: author exact 801000801925 cql: author exact 801000836378 Mark conference C1 Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems. Kurt Haelvoet, Steven Criel, F DOBBELAERE, Luc Martens (UGent) , Pascal De Langhe and R DE SMEDT (1996) Proc. of the IEEE Instrumentation and Measurement Technology Conference & IMEKO Technical Committee 7, Vol. 2, 4-6 June Brussels, Belgium, pp. 1119-1123. Mark conference C1 Theoretical and experimental quantitative characterization of the near-fields of printed circuit board interconnection structures. Steven Criel, Kurt Haelvoet, Luc Martens (UGent) , Daniël De Zutter (UGent) , Ann Franchois (UGent) , R DE SMEDT and Pascal De Langhe 1995 IEEE International Symposium on Electromagnetic Compatibility, 14-18 August 1995, Atlanta, USA, pp. 471-474..