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Thin film solid-state reactions forming carbides as contact materials for carbon-containing semiconductors
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In-situ X-ray diffraction measurements for monitoring carbide and silicide phase formation
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In-situ X-ray diffraction measurements for monitoring carbide and silicide phase formation
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- Journal Article
- A1
- open access
Solid-state formation of titanium carbide and molybdenum carbide as contacts for carbon-containing semiconductors
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The barrier height inhomogeneity in identically prepared Au/n-GaAs Schottky barrier diodes
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Influence of hydrogen treatment and annealing processes upon the Schottky barrier height of Au/n-GaAs and Ti/n-GaAs diodes