Show
Sort by
-
- Journal Article
- A1
- open access
Capturing the effects of spatial process variations in silicon photonic circuits
-
- Journal Article
- A1
- open access
Correlation between pattern density and linewidth variation in silicon photonics waveguides
-
- Conference Paper
- P1
- open access
Predicting yield of photonic circuits with wafer-scale fabrication variability
-
Accurate extraction of fabricated geometry using optical measurement
-
- Conference Paper
- P1
- open access
Hierarchical model for spatial variations of integrated photonics
-
From parameter extraction, variability models to yield prediction