Ghent University Academic Bibliography

Your filters: cql: author="van Stiphout, Koen" or (type any "bookEditor issueEditor" and editor="van Stiphout, Koen")

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- Journal Article
- A1
- open access
Impurity-enhanced solid-state amorphization : the Ni-Si thin film reaction altered by nitrogen

Koen van Stiphout, Filip Geenen (UGent) , Nuno M Santos, Sergio MC Miranda, Vincent Joly, J Demeulemeester, Christophe Detavernier (UGent) , Felipe Kremer, Lino MC Pereira, Kristiaan Temst, et al.

(2019) JOURNAL OF PHYSICS D-APPLIED PHYSICS. 52(14).
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A case study of ALD encapsulation of quantum dots: embedding supported CdSe/CdS/ZnS quantum dots in a ZnO matrix

Kilian Devloo-Casier (UGent) , Pieter Geiregat (UGent) , Karl F Ludwig, Koen van Stiphout, Andre Vantomme, Zeger Hens (UGent) , Christophe Detavernier (UGent) and Jolien Dendooven (UGent)

(2016) JOURNAL OF PHYSICAL CHEMISTRY C. 120(32). p.18039-18045
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- Conference Paper
- C3
The influence of Al alloying on silicide formation, morphology and texture between a thin (<20 nm) Ni film and Si(001)

Filip Geenen (UGent) , Koen Van Stiphout, Jean Jordan-Sweet, André Vantomme, Christian Lavoie and Christophe Detavernier (UGent)

(2015) E-MRS Spring meeting, Abstracts.
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- Conference Paper
- P1
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Influence of alloying elements on the phase formation of ultrathin Ni (<10nm) on Si(001) substrates

Filip Geenen (UGent) , Koen Van Stiphout, Jean Jordan-Sweet, André Vantomme, Christian Lavoie and Christophe Detavernier (UGent)

(2015) 2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM). p.183-185

Academic Bibliography

Impurity-enhanced solid-state amorphization : the Ni-Si thin film reaction altered by nitrogen

A case study of ALD encapsulation of quantum dots: embedding supported CdSe/CdS/ZnS quantum dots in a ZnO matrix

The influence of Al alloying on silicide formation, morphology and texture between a thin (<20 nm) Ni film and Si(001)

Influence of alloying elements on the phase formation of ultrathin Ni (<10nm) on Si(001) substrates

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