Ghent University Academic Bibliography

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Inline X-ray metrology for complementary field-effect transistors (CFET)

J. Bogdanowicz, A. Mingardi, V. Brissonneau, Roger Loo (UGent) , Y. Shimura, A. Akula, P. P. Gowda, D. Zhou, N. Horiguchi, S. Biesemans, et al.

(2025) SPIE Advanced Lithography and Patterning Conference : Metrology, Inspection, and Process Control XXXIX, Abstracts.
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- Journal Article
- A1
- open access
Future Circular Collider Feasibility Study Report : Volume 1 Physics, Experiments, Detectors

M. Benedikt, F. Zimmermann, B. Auchmann, W. Bartmann, J. P. Burnet, C. Carli, A. Chance, P. Craievich, M. Giovannozzi, C. Grojean, et al.

(2025) EUROPEAN PHYSICAL JOURNAL C. 85(12).
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- Journal Article
- A1
- open access
Future Circular Collider Feasibility Study Report : Volume 3 Civil Engineering, Implementation and Sustainability

M. Benedikt, F. Zimmermann, B. Auchmann, W. Bartmann, J. P. Burnet, C. Carli, A. Chance, P. Craievich, M. Giovannozzi, C. Grojean, et al.

(2025) EUROPEAN PHYSICAL JOURNAL-SPECIAL TOPICS. 234(17). p.5113-5383
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- Journal Article
- A1
- open access
Future Circular Collider Feasibility Study Report : Volume 2 Accelerators, Technical Infrastructure and Safety

M. Benedikt, F. Zimmermann, B. Auchmann, W. Bartmann, J. P. Burnet, C. Carli, A. Chance, P. Craievich, M. Giovannozzi, C. Grojean, et al.

(2025) EUROPEAN PHYSICAL JOURNAL-SPECIAL TOPICS. 234(19). p.5713-6197
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- Miscellaneous
- open access
Future Circular Collider Feasibility Study Report : Volume 3 Civil Engineering, Implementation and Sustainability (vol 234, pg 5113, 2025)

M. Benedikt, F. Zimmermann, B. Auchmann, W. Bartmann, J. P. Burnet, C. Carli, A. Chance, P. Craievich, M. Giovannozzi, C. Grojean, et al.

(2025) EUROPEAN PHYSICAL JOURNAL-SPECIAL TOPICS. 234. p.33-44
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- Conference Paper
- C3
- open access
Complementary Field-Effect Transistors (CFET) : metrology challenges and solutions

J. Bogdanowicz, A.-L. Charley, M. Saib, M. Beggiato, G. Lorusso, V. Brissonneau, E. Dupuy, Roger Loo (UGent) , Y. Shimura, A. Akula, et al.

(2024) International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (FCMN 2024), Abstracts.
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- Journal Article
- A2
- open access
SMBOs : buying time or improving performance?

D. Zhou, R. Jelic and Mike Wright (UGent)

(2014) MANAGERIAL AND DECISION ECONOMICS. 35(2). p.88-102

Academic Bibliography

Inline X-ray metrology for complementary field-effect transistors (CFET)

Future Circular Collider Feasibility Study Report : Volume 1 Physics, Experiments, Detectors

Future Circular Collider Feasibility Study Report : Volume 3 Civil Engineering, Implementation and Sustainability

Future Circular Collider Feasibility Study Report : Volume 2 Accelerators, Technical Infrastructure and Safety

Future Circular Collider Feasibility Study Report : Volume 3 Civil Engineering, Implementation and Sustainability (vol 234, pg 5113, 2025)

Complementary Field-Effect Transistors (CFET) : metrology challenges and solutions

SMBOs : buying time or improving performance?

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