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Interfacial properties of nMOSFETs with different Al2O3 capping layer thickness and TiN gate stacks
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- Journal Article
- A1
- open access
A low-power reflection-coefficient sensor for 28-GHz beamforming transmitters in 22-nm FD-SOI CMOS
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Guidelines for the use and interpretation of assays for monitoring autophagy (4th edition)
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Global phosphorus scarcity and full-scale P-recovery techniques: a review
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Oxygen sensitivity of atomically passivated CdS nanocrystal films
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Self-assembled multilayers of vertically aligned semiconductor nanorods on device-scale areas