Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Save this search Download search results Subscribe to news feed Your filters: cql: author="Wu, TL" or (type any "bookEditor issueEditor" and editor="Wu, TL") Add to list Journal Article A1 Toward understanding positive bias temperature instability in fully recessed-gate GaN MISFETs TL Wu, J Franco, D Marcon, B De Jaeger, Benoit Bakeroot (UGent) , S Stoffels, M Van Hove, G Groeseneken and S Decoutere (2016) IEEE TRANSACTIONS ON ELECTRON DEVICES. 63(5). p.1853-1860 Add to list Conference Paper P1 Time Dependent Dielectric Breakdown (TDDB) evaluation of PE-ALD SiN gate dielectrics on AlGaN/GaN recessed gate D-mode MIS-HEMTs and E-mode MIS-FETs TL Wu, D Marcon, B De Jaeger, M Van Hove, Benoit Bakeroot (UGent) , S Stoffels, G Groeseneken and S Decoutere (2015) International Reliability Physics Symposium. In International Reliability Physics Symposium Add to list Conference Paper P1 The impact of the gate dielectric quality in developing Au-free D-mode and E-mode recessed gate AlGaN/GaN transistors on a 200mm Si substrate TL Wu, D Marcon, B De Jaeger, M Van Hove, B Bakeroot, DN Lin, S Stoffels, XW Kang, R Roelofs, G Groeseneken, et al. (2015) Proceedings of the International Symposium on Power Semiconductor Devices & ICs. In Proceedings of the International Symposium on Power Semiconductor Devices & ICs p.225-228