Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: author="Wieers, A" or (type any "bookEditor issueEditor" and editor="Wieers, A") Add to list Journal Article A1 Wideband measurement system for on-chip ESD waveform characterisation Guus Colman (UGent) , Johan Bauwelinck (UGent) , R Gillon, A Wieers and Jan Vandewege (UGent) (2012) ELECTRONICS LETTERS. 48(3). p.147-U28