Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Save this search Download search results Subscribe to news feed Your filters: cql: author="Venegas, Rafael" or (type any "bookEditor journalEditor issueEditor" and editor="Venegas,... Add to list Journal Article A1 open access Physical origin of current collapse in Au-free AlGaN/GaN Schottky Barrier Diodes Jie Hu, Steve Stoffels, Silvia Lenci, Nicolo Ronchi, Rafael Venegas, Shuzhen You, Benoit Bakeroot (UGent) , Guido Groeseneken and Stefaan Decoutere (2014) MICROELECTRONICS RELIABILITY. 54(9-10). p.2196-2199