Ghent University Academic Bibliography

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Formation and texture of Y silicides in annealed TiN/Y thin films on Si substrates

Bert Pollefliet, Clement Porret, Alex Merkulov, Roger Loo (UGent) , Christophe Detavernier (UGent) , André Vantomme and Clement Merckling

(2026) MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING. 214.
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Anisotropic crystallization of orthorhombic ScSi on Si(001) substrates

Bert Pollefliet, Clement Porret, Jean-Luc Everaert, Kiroubanand Sankaran, Olivier Richard, Han Han, Roger Loo (UGent) , Christophe Detavernier (UGent) , André Vantomme and Clement Merckling

(2026) APL MATERIALS. 14(4).
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Formation and texture of ScSi from Sc thin films deposited on Si substrates

Bert Pollefliet, Clement Porret, Jean-Luc Everaert, Kiroubanand Sankaran, Olivier Richard, Han Han, Alex Merkulov, Marta Agati, Roger Loo (UGent) , Christophe Detavernier (UGent) , et al.

(2026) JOURNAL OF APPLIED PHYSICS. 140(2).
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The core/shell interface in InP/ZnSe colloidal quantum dots

Luca Giordano (UGent) , Pieter Schiettecatte (UGent) , Yannick Coppel, Qiang Zhao, Yannic U. Staechelin, Guillaume Bonifas, Hannes Van Avermaet (UGent) , Celine Nayral, Holger Lange, Andre Vantomme, et al.

(2025) CHEMISTRY OF MATERIALS. 37(21). p.8724-8732
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Crystallographic defects in orthorhombic ScSi / Si(001) contacts

Bert Pollefliet, Clement Porret, Olivier Richard, Jean-Luc Everaert, Roger Loo (UGent) , Christophe Detavernier (UGent) , André Vantomme and Clement Merckling

(2025) MAM 2025, Materials for Advanced Metallization, Abstracts.
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Analysis of the Sc silicide formation mechanisms by medium-energy ion scattering

André Vantomme, Radek Holenak, Kevin Vomschee, Eleni Ntemou, Tuan Tran, Bert Pollefliet, Clement Porret, Roger Loo (UGent) , Clement Merckling and Daniel Primetzhofer

(2025) 27th Ion Beam Analysis (IBA) & 19th Particle-Induced X-ray Emission (PIXE) joint international conferences, Abstracts.
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Enhanced surface passivation of InP/ZnSe quantum dots by zinc acetate exposure

Pieter Schiettecatte (UGent) , Luca Giordano (UGent) , Ben Cruyssaert, Guillaume Bonifas, Norick De Vlamynck (UGent) , Hannes Van Avermaet (UGent) , Qiang Zhao, Andre Vantomme, Celine Nayral, Fabien Delpech, et al.

(2024) CHEMISTRY OF MATERIALS. 36(12). p.5996-6005
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Effects of strain on diborane dissociative adsorption and boron incorporation on Si0.5Ge0.5(001)-2×1 surfaces

Gianluca Rengo, Geoffrey Pourtois, Clement Porret, Roger Loo (UGent) and André Vantomme

(2024) JOURNAL OF PHYSICAL CHEMISTRY C. 128(30). p.12437-12449
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Texture of orthorhombic ScSi in annealed TiN / Sc / Si(:P)(001) contact stacks

Bert Pollefliet, Clement Porret, Christophe Detavernier (UGent) , Jean-Luc Everaert, Kiroubanand Sankaran, Erik Rosseel, Roger Loo (UGent) , André Vantomme and Clement Merckling

(2024) 2024 International Conference on Solid State Devices and Materials, Abstracts.
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Crystallinity and composition of Sc1-x(-y)Si x(P y) silicides in annealed TiN/Sc/Si:P stacks for advanced contact applications

Bert Pollefliet, Clement Porret, Jean-Luc Everaert, Kiroubanand Sankaran, Xiaoyu Piao, Erik Rosseel, Thierry Conard, Andrea Impagnatiello, Yosuke Shimura, Naoto Horiguchi, et al.

(2024) JAPANESE JOURNAL OF APPLIED PHYSICS. 63(2).

Academic Bibliography

Formation and texture of Y silicides in annealed TiN/Y thin films on Si substrates

Anisotropic crystallization of orthorhombic ScSi on Si(001) substrates

Formation and texture of ScSi from Sc thin films deposited on Si substrates

The core/shell interface in InP/ZnSe colloidal quantum dots

Crystallographic defects in orthorhombic ScSi / Si(001) contacts

Analysis of the Sc silicide formation mechanisms by medium-energy ion scattering

Enhanced surface passivation of InP/ZnSe quantum dots by zinc acetate exposure

Effects of strain on diborane dissociative adsorption and boron incorporation on Si0.5Ge0.5(001)-2×1 surfaces

Texture of orthorhombic ScSi in annealed TiN / Sc / Si(:P)(001) contact stacks

Crystallinity and composition of Sc1-x(-y)Si x(P y) silicides in annealed TiN/Sc/Si:P stacks for advanced contact applications

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