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On the evolution of strain and electrical properties in As-grown and annealed Si:P epitaxial films for source-drain stressor applications
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Influence of the chalcogen element on the filament stability in Culn(Te,Se,S)(2)/Al2O3 filamentary switching devices
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Tuning the switching behavior of conductive-bridge resistive memory by the modulation of the cation-supplier alloys
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Quasi two-dimensional Si-O superlattices : atomically controlled growth and electrical properties
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Understanding the dual nature of the filament dissolution in conductive bridging devices
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Scanning probe microscopy as a scalpel to probe filament formation in conductive bridging memory devices
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Three-dimensional observation of the conductive filament in nanoscaled resistive memory devices
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Influence of carbon alloying on the thermal stability and resistive switching behavior of copper-telluride based CBRAM cells
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Switching mechanism and reverse engineering of low-power Cu-based resistive switching devices
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High-k dielectrics and metal gates for future generation memory devices