Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: author="Vais, A." or (type any "bookEditor issueEditor" and editor="Vais, A.") Add to list Conference Paper P1 A defect characterization technique for the sidewall surface of Nano-ridge and Nanowire based Logic and RF technologies A. Vais, B. Hsu, O. Syshchyk, H. Yu, A. Alian, Y. Mols, V Kodandarama, K., B. Kunert, N. Waldron, Eddy Simoen (UGent) , et al. (2021) 2021 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). In International Reliability Physics Symposium Add to list Conference Paper C3 open access III/V nano-ridge engineering for device integration on 300 mm silicon B. Kunert, Davide Colucci (UGent) , M. Baryshnikova, Y. Mols, R. Alcotte, Dries Van Thourhout (UGent) , Cenk Ibrahim Özdemir (UGent) , Y. De Koninck, N. Kuznetsova, D. Yudistira, et al. (2021) Compound Semiconductor Week (CSW-2021), Abstracts.