Ghent University Academic Bibliography

Your filters: cql: author="VAN VAECK, L" or (type any "bookEditor issueEditor" and editor="VAN VAECK, L")

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- Journal Article
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Characterisation of the surface composition in electrospun nanowebs with static secondary ion mass spectrometry (S-SIMS)

P VAN ROYEN, Etienne Schacht (UGent) , Luc Ruys (UGent) and L VAN VAECK

(2007) TALANTA. 71(4). p.1464-1469
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- Journal Article
- A1
Synthesis and characterization of novel poly[(organo)phosphazenes] with cell-adhesive side groups

M HEYDE, M MOENS, L VAN VAECK, KM SHAKESHEFF, MC DAVIES and Etienne Schacht (UGent)

(2007) BIOMACROMOLECULES. 8(5). p.1436-1445
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- Conference Paper
- C1
Imaging of electrospun nanofibres with static and dynamic secondary ion mass spectrometry (S-SIMS and Nano-SIMS)

P VAN ROYEN, L VAN VAECK, L RUYS, A DOS SANTOS, Peter Dubruel (UGent) , Etienne Schacht (UGent) , J AUDINOT and H MIGEON

(2007) 7th International Symposium on Frontiers in Biomedical Polymers. In honour of the late Professor Junzo Sunamoto Program and abstract book. p.165-165
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- Journal Article
- A1
Static secondary ion mass spectrometry for nanoscale analysis: surface characterisation of electrospun nanofibres

P VAN ROYEN, Etienne Schacht (UGent) , Luc Ruys (UGent) and L VAN VAECK

(2006) RAPID COMMUNICATIONS IN MASS SPECTROMETRY. 20(3). p.346-352
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- Journal Article
- A1
- open access
The use of time-of-flight static secondary ion mass spectrometry imaging for the molecular characterization of single aerosol surfaces

R VAN HAM, Mieke Adriaens (UGent) , L VAN VAECK and F ADAMS

(2006) ANALYTICA CHIMICA ACTA. 558(1-2). p.115-124
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- Journal Article
- A1
Characterisation of electrospun nanowebs with static secondary ion mass spectrometry (S-SIMS)

P VAN ROYEN, AM DOS SANTOS, Etienne Schacht (UGent) , Luc Ruys (UGent) and L VAN VAECK

(2006) APPLIED SURFACE SCIENCE. 252(19). p.6992-6995
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- Journal Article
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- open access
Static secondary ion mass spectrometry (S-SIMS) analysis of atmospheric plasma treated polypropylene films

B BOSCHMANS, M VANNESTE, L RUYS, Eef Temmerman, Christophe Leys (UGent) and L VAN VAECK

(2006) APPLIED SURFACE SCIENCE. 252(19). p.6660-6663
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- Journal Article
- A1
- open access
Static secondary ion mass spectrometry (S-SIMS) for the characterization of surface components in mineral particulates

R VAN HAM, L VAN VAECK, Mieke Adriaens (UGent) , F ADAMS, B HODGES, A GIANOTTO, R AVCI, A APPELHANS and G GROENEWOLD

(2006) TALANTA. 69(1). p.91-96
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- Journal Article
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- open access
Feasibility of analyzing molecular pigments in paint layers using TOF S-SIMS

R VAN HAM, L VAN VAECK, F ADAMS and Mieke Adriaens (UGent)

(2005) ANALYTICAL AND BIOANALYTICAL CHEMISTRY. 383(6). p.991-997
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Comparison of Ga+ and SF5+ primary ions for the molecular speciation of oxysalts in static secondary ion mass spectrometry (S-SIMS)

R VAN HAM, L VAN VAECK, F ADAMS and Mieke Adriaens (UGent)

(2005) JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY. 20(10). p.1088-1094

Academic Bibliography

Characterisation of the surface composition in electrospun nanowebs with static secondary ion mass spectrometry (S-SIMS)

Synthesis and characterization of novel poly[(organo)phosphazenes] with cell-adhesive side groups

Imaging of electrospun nanofibres with static and dynamic secondary ion mass spectrometry (S-SIMS and Nano-SIMS)

Static secondary ion mass spectrometry for nanoscale analysis: surface characterisation of electrospun nanofibres

The use of time-of-flight static secondary ion mass spectrometry imaging for the molecular characterization of single aerosol surfaces

Characterisation of electrospun nanowebs with static secondary ion mass spectrometry (S-SIMS)

Static secondary ion mass spectrometry (S-SIMS) analysis of atmospheric plasma treated polypropylene films

Static secondary ion mass spectrometry (S-SIMS) for the characterization of surface components in mineral particulates

Feasibility of analyzing molecular pigments in paint layers using TOF S-SIMS

Comparison of Ga+ and SF5+ primary ions for the molecular speciation of oxysalts in static secondary ion mass spectrometry (S-SIMS)

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