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Modeling of gate capacitance of GaN-based trench-gate vertical metal-oxide-semiconductor devices
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Modeling of the vertical leakage current in AlN/Si heterojunctions for GaN power applications
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GaN-on-SOI : monolithically integrated All-GaN ICs for power conversion
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Buffer vertical leakage mechanism and reliability of 200-mm GaN-on-SOI
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Gate reliability of p-GaN HEMT with gate metal retraction
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Perimeter driven transport in the p-GaN gate as a limiting factor for gate reliability
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Trading off between threshold voltage and subthreshold slope in AlGaN/GaN HEMTs with a p-GaN gate
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Analytical model for the threshold voltage of ${p}$ -(Al)GaN high-electron-mobility transistors
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The impact of Ti/Al contacts on AlGaN/GaN HEMT vertical leakage and breakdown
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Time-dependent breakdown mechanisms and reliability improvement in edge terminated AlGaN/GaN Schottky diodes under HTRB tests