Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Save this search Download search results Subscribe to news feed Your filters: cql: author="Ruzzarin, M." or (type any "bookEditor issueEditor" and editor="Ruzzarin, M.") Add to list Journal Article Exploration of gate trench module for vertical GaN devices M. Ruzzarin, K. Geens, M. Borga, H. Liang, S. You, Benoit Bakeroot (UGent) , S. Decoutere, C. De Santi, A. Neviani, M. Meneghini, et al. (2020) MICROELECTRONICS RELIABILITY. 114.