Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: author="Rossetto, Isabella" or (type any "bookEditor issueEditor" and editor="Rossetto, Isabella") Add to list Journal Article A1 Time-dependent breakdown mechanisms and reliability improvement in edge terminated AlGaN/GaN Schottky diodes under HTRB tests Jie Hu, Steve Stoffels, Ming Zhao, Andrea Natale Tallarico, Isabella Rossetto, Matteo Meneghini, Xuanwu Kang, Benoit Bakeroot (UGent) , Denis Marcon, Ben Kaczer, et al. (2017) IEEE ELECTRON DEVICE LETTERS. 38(3). p.371-374