Ghent University Academic Bibliography

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Machine learning based error detection in transient susceptibility tests

Roberto Medico, Niels Lambrecht (UGent) , Hugo Pues, Dries Vande Ginste (UGent) , Dirk Deschrijver (UGent) , Tom Dhaene (UGent) and Domenico Spina (UGent)

(2019) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 61(2). p.352-360
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- Journal Article
- A1
- open access
A circuit modeling technique for the ISO 7637-3 capacitive coupling clamp test

Niels Lambrecht (UGent) , H. Pues, Daniël De Zutter (UGent) and Dries Vande Ginste (UGent)

(2018) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 60(4). p.858-865
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Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test

Niels Lambrecht (UGent) , Daniël De Zutter (UGent) , Dries Vande Ginste (UGent) and Hugo Pues

(2017) 2017 INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY - EMC EUROPE. In IEEE International Symposium on Electromagnetic Compatibility p.1-5
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- A1
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Modeling of contact bounce in a transient electromagnetic compatibility test for the analysis and optimization of nonlinear devices

Niels Lambrecht (UGent) , H Pues, Daniël De Zutter (UGent) and Dries Vande Ginste (UGent)

(2017) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 59(2). p.541-544
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Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust

Niels Lambrecht (UGent) , Daniël De Zutter (UGent) , Dries Vande Ginste (UGent) and H. Pues

(2017) p.141-145
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Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test

Niels Lambrecht (UGent) , Daniël De Zutter (UGent) , Dries Vande Ginste (UGent) and H. Pues

(2017) p.1-5
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Efficient circuit modeling technique for the analysis and optimization of ISO 10605 field coupled Electrostatic Discharge (ESD) robustness of nonlinear devices

Niels Lambrecht (UGent) , C. Gazda, H. Pues, Daniël De Zutter (UGent) and Dries Vande Ginste (UGent)

(2016) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 58(4). p.971-980
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- Conference Paper
- C1
- open access
An immunity modeling technique to predict the influence of continuous wave and amplitude modulated noise on nonlinear analog circuits

C Gazda, Dries Vande Ginste (UGent) , Hendrik Rogier (UGent) , Ivo Couckuyt (UGent) , Tom Dhaene (UGent) , K Stijnen and H Pues

(2013) The International Symposium on Electromagnetic Compatibility, Proceedings. p.748-752
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- A1
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Harmonic balance surrogate-based immunity modeling of a nonlinear analog circuit

C Gazda, Dries Vande Ginste (UGent) , Hendrik Rogier (UGent) , Ivo Couckuyt (UGent) , Tom Dhaene (UGent) , K Stijnen and H Pues

(2013) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 55(6). p.1115-1124
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- Conference Paper
- P1
- open access
Translation of automotive module RF immunity test limits into equivalent IC test limits using S-parameter IC models

Hugo Pues, Ben Briké, Celina Gazda, Peter Teichmann, Kristof Stijnen, Christian Peeters, André Durier and Dries Vande Ginste (UGent)

(2013) 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits. p.249-253

Academic Bibliography

Machine learning based error detection in transient susceptibility tests

A circuit modeling technique for the ISO 7637-3 capacitive coupling clamp test

Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test

Modeling of contact bounce in a transient electromagnetic compatibility test for the analysis and optimization of nonlinear devices

Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust

Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test

Efficient circuit modeling technique for the analysis and optimization of ISO 10605 field coupled Electrostatic Discharge (ESD) robustness of nonlinear devices

An immunity modeling technique to predict the influence of continuous wave and amplitude modulated noise on nonlinear analog circuits

Harmonic balance surrogate-based immunity modeling of a nonlinear analog circuit

Translation of automotive module RF immunity test limits into equivalent IC test limits using S-parameter IC models

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