Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: author="Posthuma, N. E." or (type any "bookEditor issueEditor" and editor="Posthuma, N. E.") Add to list Journal Article A1 Role of the AlGaN barrier on the long-term gate reliability of power HEMTs with p-GaN gate A. N. Tallarico, N. E. Posthuma, Benoit Bakeroot (UGent) , S. Decoutere, E. Sangiorgi and C. Fiegna (2020) MICROELECTRONICS RELIABILITY. 114(SI). Add to list Conference Paper P1 Failure mode for p-GaN gates under forward gate stress with varying Mg concentration S. Stoffels, B. Bakeroot, T. L. Wu, D. Marcon, N. E. Posthuma, S. Decoutere, A. N. Tallarico and C. Fiegna (2017) 2017 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). In International Reliability Physics Symposium