Ghent University Academic Bibliography

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Four-point bending cycling : the alternative for thermal cycling solder fatigue testing of electronic components

Bart Vandevelde, Filip Vanhee, Davy Pissoort, Lieven Degrendele (UGent) , Johan De Baets (UGent) , Bart Allaert, Ralph Lauwaert, Franco Zanon, Riet Labie and Geert Willems

(2017) MICROELECTRONICS RELIABILITY. 74. p.131-135
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- Journal Article
- A1
- open access
Accurate hotspot localization by sampling the near-field pattern of electronic devices

Prashant Singh (UGent) , Dirk Deschrijver (UGent) , Davy Pissoort and Tom Dhaene (UGent)

(2013) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 55(6). p.1365-1368
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- Conference Paper
- C3
- open access
Efficient measurement procedure for hotspot detection in near-field pattern of electronic devices

Prashant Singh (UGent) , Dirk Deschrijver (UGent) , Davy Pissoort and Tom Dhaene (UGent)

(2013) BESTCOM Meeting, Abstracts.
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- Journal Article
- A1
- open access
Automated near-field scanning algorithm for the EMC analysis of electronic devices

Dirk Deschrijver (UGent) , Filip Vanhee, Davy Pissoort and Tom Dhaene (UGent)

(2012) IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. 54(3). p.502-510
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- Conference Paper
- C1
- open access
Practical implementation of a sequential sampling algorithm for EMI near-field scanning

Bram Van der Streek, Filip Vanhee, Bart Boesman, Davy Pissoort, Dirk Deschrijver (UGent) , Ivo Couckuyt (UGent) and Tom Dhaene (UGent)

(2012) The International Symposium on Electromagnetic Compatibility, Proceedings. p.1-5
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Comparing EMC-signatures by FSV as a quality assessment tool

Jos Knockaert (UGent) , Davy Pissoort and Filip Vanhee

(2011) PIERS 2011 Marrakesh : proceedings. p.1099-1103
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- Conference Paper
- C1
- open access
EMC-signatures of microcontrollers under thermal stress analyzed by FSV

Jos Knockaert (UGent) , Mohamed Malki, David Baudry, Mohamed Ramdani and Davy Pissoort

(2011) 8th international workshop on electromagnetic compatibility of integrated circuits, Proceedings.
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Radiated emission of an inverter fed motor drive system in a frequency range from 30 to 200 MHz

Joan Peuteman, Tommy Verbeerst, Jos Knockaert (UGent) , Davy Pissoort, Dries Vanoost and Isabelle Vervenne

(2011) ANNUAL JOURNAL OF ELECTRONICS. 5(1). p.157-160
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Adaptive time-domain macromodeling algorithm for fast termination of FDTD simulations

Dirk Deschrijver (UGent) , Davy Pissoort and Tom Dhaene (UGent)

(2010) 2010 IEEE 14th Workshop on Signal Propagation on Interconnects (SPI 2010). p.131-132
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Adaptive stopping criterion for fast time domain characterization of microwave components

Dirk Deschrijver (UGent) , Davy Pissoort and Tom Dhaene (UGent)

(2009) IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS. 19(12). p.765-767

Academic Bibliography

Four-point bending cycling : the alternative for thermal cycling solder fatigue testing of electronic components

Accurate hotspot localization by sampling the near-field pattern of electronic devices

Efficient measurement procedure for hotspot detection in near-field pattern of electronic devices

Automated near-field scanning algorithm for the EMC analysis of electronic devices

Practical implementation of a sequential sampling algorithm for EMI near-field scanning

Comparing EMC-signatures by FSV as a quality assessment tool

EMC-signatures of microcontrollers under thermal stress analyzed by FSV

Radiated emission of an inverter fed motor drive system in a frequency range from 30 to 200 MHz

Adaptive time-domain macromodeling algorithm for fast termination of FDTD simulations

Adaptive stopping criterion for fast time domain characterization of microwave components

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