Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: author="Park, Min Hyuk" or (type exact bookEditor and editor="Park, Min Hyuk") Add to list Journal Article A1 Effect of annealing ferroelectric HfO2 thin films : in situ, high temperature X-ray diffraction Min Hyuk Park, Ching-Chang Chung, Tony Schenk, Claudia Richter, Karl Opsomer, Christophe Detavernier (UGent) , Christoph Adelmann, Jacob L Jones, Thomas Mikolajick and Uwe Schroeder (2018) ADVANCED ELECTRONIC MATERIALS. 4(7).