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- Journal Article
- A1
- open access
New Cs sputter ion source with polyatomic ion beams for secondary ion mass spectrometry applications
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- Journal Article
- A1
- open access
The use of ultra-low-energy dynamic SIMS in the study of the tarnishing of silver
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- Journal Article
- A1
- open access
Temperature dependence of secondary ion emission from tantalum produced by atomic and polyatomic gold projectiles
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- Journal Article
- A1
- open access
Non-additivity of multiply charged ion emission from Si and Al produced by molecular projectiles
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Non-additive sputtering of niobium and tantalum as neutral and charged clusters
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Effect of the relaxation of the electron subsystem excitation in metals on the ionization probability of sputtered atoms
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Features of non-additive sputtering for various 'molecular projectile-solid' systems
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Effect of the projectile parameters on the charge state formation process in solid sputtering
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- Journal Article
- A1
- open access
Effect of projectile parameters on charge state formation of sputtered atoms
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- Journal Article
- A1
- open access
Nonadditive sputtering of silicon by keV energy molecular projectiles of heavy and light elements